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Thin Solid Films, Vol.377-378, 803-808, 2000
Growth of epitaxial doped strontium sulfide thin films by pulsed laser deposition
Epitaxial luminescent thin films of doped strontium sulfide (SrS) have been grown using pulsed laser deposition (PLD). SrS films double doped with Eu and Sm, Ce and Sm and Cu and Ge were deposited with thicknesses ranging from 0.05 to 2 mum on MgO(001) substrates. Optical microscopy, scanning electron microscopy (SEM) and atomic force microscopy (AFM) analysis were used to study the films' surface morphology. The PLD-grown films were highly oriented as determined by their X-ray diffraction (XRD) spectra and showed signs of little or no strain, and very low lattice mismatch when deposited on MgO. The best results were obtained for films deposited between 750 and 800 degreesC and under H2S background pressures ranging from 10 to 20 mtorr. The thermally-stimulated luminescence properties of these films were evaluated as well. The data indicate that these films would be well-suited for display applications.
Keywords:strontium sulfide thin films;epitaxial;pulsed laser deposition;SrS : Eu,Sm;SrS : Ce,Sm;SrS : Cu,Ge