The electron transmission and dissociative electron attachment spectra in the series of compounds (CH3)(4-n)MCln, with M = C, Si, Ge, and Sn, are presented (except for the di- and trichloro germanium derivatives). The experimental resonance energies for temporary electron attachment to these compounds are compared with the total electron scattering cross sections obtained by means of continuum multiple-scattering (MS) X alpha calculations and with the attachment energies calculated with the bound-state MS-X alpha method, which also evaluates positive electron affinity Values and provides the localization properties of the various empty orbitals. For all the compounds considered the LUMO is predicted to possess a(1) symmetry. The silicon and tin derivatives display the smallest and largest electron-acceptor properties, respectively. The measurements of the fragment anion current, as a function of the incident electron energy, reveal quite different behaviors in the various compounds with respect to dissociative electron attachment from both the quantitative and qualitative points of view.