We describe a method for the explicit determination of the segment density profile phi(z) of surface-attached polymer brushes with multiple angle of incidence null-ellipsometry. Because the refractive index contrast between the brush layer and the solvent is weak, multiple reflections are of minor influence and the ellipsometric spectrum is closely related to the Fourier transform of the refractive index profile, thereby allowing for explicit inversion of the ellipsometric data. We chose surface-attached monolayers of polymethacrylic acid (PMAA), a weak polyelectrolyte, as a model system and determined the segment density profile of this system as a function of the pH value of the surrounding medium by the Fourier method. Complementary to the Fourier analysis, fits with error functions are given as well. The brushes were prepared on the bases of high refractive index prisms with the "grafting-from" technique. In water, the brushes swell by more than a factor of 30. The swelling increases with increasing pH because of a growing fraction of dissociated acidic groups leading to a larger electrostatic repulsion.