화학공학소재연구정보센터
Journal of Materials Science, Vol.34, No.10, 2263-2267, 1999
Defect-induced microstructures: an X-ray diffraction analysis
Single crystal X-ray diffraction was applied in order to investigate defect-induced microstructures in radiation damaged zircon. The formation of domains with different degrees of order was observed and in particular, it was possible to distinguish two types of defects: isolated lattice defects and dislocations. These lattice deformations have a great influence on the structural and physical properties of the materials.