The silicon wafer hydrophobized with OTS was immersed into water to observe the surface in-situ by tapping-mode AFM. A large number of nano-size domain images:were found on the surface. Their shapes were characterized by the height image procedure of AFM, and the differences of the properties compared to those of the bare surface were analyzed using the phase image procedure and the interaction force curves. All the results consistently implied that the domains represent the nanoscopic bubbles attached on the surface. This was confirmed by the fact that no domain was observed in the case of the surfaces hydrophobized in the AFM fluid cell without exposure to air. The apparent contact angle of the bubbles was much smaller than that expected macroscopically, which was postulated to be the reason bubbles were able to sit stably on the surface.