HWAHAK KONGHAK, Vol.28, No.4, 411-416, August, 1990
이온교환된 X형 및 Y형 제올라이트의 탈알루미늄에 대한 X선 광전자분광학적 해석
X-ray Photoelectron Spectroscopic Analysis for Dealumination of lon Exchanged Zelite -X and -Y
초록
1N 금속염화물 수용액을 사용한 이온교환반응에서 X형 및 Y형 제올라이트로부터 Al 원자가 빠져나가는 탈알루미늄 현상에 대해 양이온의 영향을 조사하였다. X선 광전자분광법(XPS)과 X선 형광분석법(XRF)을 통해 Na+, Ca2+, Fe2+, Fe3+가 교환된 제올라이트의 탈알루미늄을 연구하였다. 이온교환된 제올라이트의 내부조성과 표면에서의 Al/Si 비를 양이온의 pKh 값과 관련지어 연구하였다. 특히 제올라이트 표면에서의 Al/Si 비를 얻거나 알루미늄원자의 2p궤도 전자결합 에너지를 결정하기 위하여 XPS법이 이용되었다. 실험적인 결과로서 내부보다는 표면의 Al/Si 비가 작았으며 XPS를 통해서 Al2p 전자의 전자결합에너지가 표면의 알루미늄 함량감소에 따라 비례적으로 감소함을 알 수 있었다. 이같은 사실은 표면에서의 Al/Si 비의 감소와 골격내 Al-O 결합의 결합력 약화가 직접적으로 서로 연관되어 있기 때문이다.
The chemical extraction of Al atoms from X and Y zeolites during ion-exchanged procedures using 1N metal chloride solution was studied to investigate the effect of cation on dealumination. Correlated X-ray photoelectron spectroscopy(XPS) and X-ray fluorescence spectroscopy(XRF) studies have been carried out on the dealumination of Na+, Ca2+, Fe2+ -and Fe3+ -exchanged zeolites. The Al/Si ratios of bulk and surface on ion-exchanged zeolite were studied as a function of pKh. Especially, XPS has been used to obtain the Al/Si ratio of zeolite surface and to determine the binding energy(Eb) of Al2p electron. We found that the Al/Si ratio of the surface is less than that of the bulk. The XPS results show that decreasing aluminum content of surface proportionally decrease the binding energy of Al2p elec-tron. It has been also derived that the decrease of surface Al/Si ratio is directly related to the weakening of Al-O bond in framework.
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