Creep tests have been carried out on Al-Si-Cu alloy thin foils with thicknesses of 10 and 30 mum at 200 degreesC. The results obtained have been assessed in comparison with those previously obtained on foils with thicknesses ranging from 50 to 100 mum In the present study, the creep rate obtained in the thickness range under 50 mum decreases with decreasing specimen thickness, as opposed to the previously obtained dependence of creep rate on specimen thickness in the thickness range from 50 to 100 mum. Texture of specimens with thicknesses ranging from 10 to 100 mum has been examined using X-ray diffraction. The textural components change with the specimen thickness in the range below 50 mum. This being combined with the difference in Taylor factor of each component, is presumed to explain the different dependence of creep rate on specimen thickness in the thickness range below 50 mum.