Previous Article Next Article Table of Contents Journal of Materials Science Letters, Vol.19, No.4, 353-355, 2000 DOI10.1023/A:1006791520628 Export Citation Atomic force microscopy analysis of buckling phenomena in metallic thin films on substrates Branger V, Coupeau C, Goudeau P, Boubeker B, Badawi KF, Grilhe J Please enable JavaScript to view the comments powered by Disqus.
