Previous Article Next Article Table of Contents Journal of Materials Science Letters, Vol.19, No.17, 1505-1508, 2000 DOI10.1023/A:1006748316733 Export Citation Structural characterization of partially crystallized phases embedded in low temperature MOCVD-grown PbTiO3 thin films Wang CH, Choi DJ Please enable JavaScript to view the comments powered by Disqus.
