Previous Article Next Article Table of Contents Journal of Materials Science Letters, Vol.20, No.3, 245-247, 2001 DOI10.1023/A:1006737305313 Export Citation Gettering phenomenon of oxidation-induced stacking-faults in silicon-on-insulator structure by water-direct-bonding method Kim KT, Choi DJ Please enable JavaScript to view the comments powered by Disqus.
