Previous Article Next Article Table of Contents Journal of Materials Science Letters, Vol.20, No.10, 933-935, 2001 DOI10.1023/A:1010989018883 Export Citation Phase analysis of PZT 52/48 thin films by synchrotron XRD Liu Y, Xu C, Liu H, Toraya H, Watanabe T Please enable JavaScript to view the comments powered by Disqus.
