Previous Article Next Article Table of Contents Journal of Materials Science Letters, Vol.20, No.14, 1335-1337, 2001 DOI10.1023/A:1010915004750 Export Citation In situ TEM observation of the formation of nickel nanocrystals in Ni-implanted amorphous SiO2 thin films Jiang CZ Please enable JavaScript to view the comments powered by Disqus.
