In this investigation, the adhesion between particles and plates with root-mean-square, rms, surface roughness of 0.17-10.5 nm was measured by atomic force microscopy. Measurements obtained with particles both larger and smaller than the surface asperities are presented. Results indicate adhesion force decreases sharply with increasing surface roughness in the nanometer scale (<2 nm), followed by a gradual and slow decrease with further increase in roughness. Existing models were found to significantly underestimate adhesion force. Hence, a new model based on a geometry that considers both the height and breadth of asperities yielding an increased asperity radius compared to previous approaches, as detailed in Part I of this series, is applied using both van der Waals and elastic deformation/work of adhesion based approaches. For the system studied in this investigation, the adhesion forces predicted by the proposed model are considerably more accurate than those predicted by past models.