A self-contained experimental technique is proposed for measuring the absolute optical absorption spectra, thermal diffusivity, and thermal conductivity of polymer thin films. The technique is based on photothermal deflection spectroscopy and provides sensitivity that is high enough to quantify the very small optical absorption losses in polymer films used for optical waveguide applications. The capabilities of the technique are demonstrated with measurements performed on thin films of poly(methyl methacrylate) and a fluorinated polymer (CYTOP). An error analysis is presented, and the factors are discussed that influence the accuracy of the technique.