Previous Article Next Article Table of Contents Polymer Science and Technology, Vol.7, No.1, 75-85, February, 1996 Export Citation [고분자분석기술 지상강좌] 주사전자현미경(Scanning Electron Microscopy, SEM)과 전자 X-ray를 이용한 고분자소재 분석 Scanning Electron Microscopy and X-ray Microanalysis of Polymeric Materials 박종래 Please enable JavaScript to view the comments powered by Disqus.
