Journal of Vacuum Science & Technology B, Vol.19, No.6, 2073-2076, 2001
In situ submicron patterning with silicon nitride evaporation masks
We describe a technique for ultra-high-vacuum compatible deposition of structures on flat substrates. This technique allows one to form micrometer and even submicron-sized structures on a flat surface with minimal contamination. It also has the advantage of producing a smooth edge profile similar to those achieved using a two-layered resist.