We have developed a scanning displacement current microscope (SDM) winch measures the electrical surface properties of samples by displacement current SDM vibrates its probe perpendicularly to the sample with applying dc. voltage to the probe. Both displacement current and tunneling current flow periodically in accordance with the vibration of the probe and are separated by using a two-phase lock-in amplifier In this paper, we observe both displacement current image and the topographic image of a sample with gating profile simultaneously under constant tunneling current operation. We also analyze the resolution of the displacement current image.