The Rietveld refinement on the aluminum sheet prepared by a cold rolling process was studied using both the X-ray diffraction data of the normal direction in the sample orientation and the pole figure data of three reflections: (111), (200), and (220). The agreement between calculated and observed patterns was not satisfactory due to the preferred orientation effect of the aluminum sheet. The Rietveld refinement on the aluminum sheet could be successfully preformed by applying the pole density of each reflection obtained from the corresponding inverse pole figure to the X-ray diffraction data. The final R-weighted pattern, R-wp, was 7.18%, and the goodness-of-fit indicator, S, was 1.41.