Electrochimica Acta, Vol.47, No.15, 2371-2380, 2002
Electrochemical quartz crystal microbalance studies of thin-solid films of higher fullerenes: C-76, C-78 and C-84
Thin-solid films of higher fullerenes, viz. C-76, C-78 and C-84, were prepared by the drop coating technique and characterized by simultaneous cyclic voltammetry and piezoelectric microgravimetry with the use of an electrochemical quartz crystal microbalance. Properties of the films were compared with those reported earlier for the C-60 and C-70 thin-solid films. The effect of nature of the counter cation on electrochemical properties of the films has been probed by employing acetonitrile solutions of two different 0.1 M supporting electrolytes, namely tetra(n-butyl)ammonium (TBA(+)) hexafluorophosphate and potassium hexafluorophosphate. Stability of the films with respect to dissolution depends on the fullerene oxidation state as well as on the nature of both the fullerene in the film and the counter cation in the supporting electrolyte. The TBA(+) counter cation ingress to the film for compensation of the negative charge of the reduced fullerene is accompanied by the acetonitrile solvent intake. The number of acetonitrile molecules per TBA(+) counter cation entering the film is higher the higher the fullerene. Also, the Langmuir films of higher fullerenes were prepared at the air-water interface and the film morphology was characterized by the Brewster angle microscopy.
Keywords:higher fullerenes;C-76;C-78;C-84 thin-solid films;Langmuir films;conducting fullerene films;ion dynamics;ion transport;cyclic vottammetry;piezoelectric microgravimetry;electrochemical quartz crystal microbalance;Brewster angle microscopy