Previous Article Next Article Table of Contents Journal of Materials Science Letters, Vol.21, No.8, 647-648, 2002 DOI10.1023/A:1015600423981 Export Citation Microstructural and analytical investigation of low temperature crystallized amorphous silicon/crystallized silicon interface using SEM and EDS Kishore R, Sood KN, Naseem HA Please enable JavaScript to view the comments powered by Disqus.
