Thin Solid Films, Vol.424, No.1, 75-78, 2003
Determination of the nature of principal scattering mechanism in well-annealed vacuum deposited thin films of the ternary thermoelectric material Bi-2(Te0.8Se0.2)(3)
Resistivity and thermopower measurements were performed on thin films of Bi-2(Te0.8Se0.2)(3) prepared by flash evaporation technique. Applying the Jain-Verma theory to the experimental data of Bi-2(Te0.8Se0.2)(3), scattering index parameter was evaluated. The value of scattering index parameter was found to lie between -0.3 and -0.2. This indicates the presence of other scattering mechanisms, in addition to the lattice scattering.