Thin Solid Films, Vol.431-432, 312-316, 2003
Preparation of stoichiometric CuInS2 surfaces - an XPS and UPS study
CuInS2 films are investigated with photoelectron spectroscopy. We find significant deviation from the stoichiometric composition depending on the preparation on the films. For Cu-rich films (start composition) we show that by At sputtering and annealing the surface composition varies along a binary cut of the Cu-In-S ternary phase diagram. We also present a novel technique which brings the surface composition close to the stoichiometric stability range of the CuInS2 phase. The technique used the evaporation of Cu on the sputter cleaned surface. (C) 2003 Elsevier Science B.V. All rights reserved.