Previous Article Next Article Table of Contents Journal of Materials Science Letters, Vol.22, No.18, 1255-1258, 2003 DOI10.1023/A:1025402017295 Export Citation XPS analysis of light elements (C, N) remaining in sol-gel derived TiO2 films Shi ZM, Ye XY, Liang KM, Gu SR, Pan F Please enable JavaScript to view the comments powered by Disqus.
