An application of wavelet multiresolution analysis (WMA) to phase-sensitive neutron specular reflection is described. By use of Daubechies-8 wavelets, it is shown how the WMA notions of trend and detail are well-suited to describing the effects of truncated data on the spatial behavior of the scattering length density (SLD) profiles inferred from measurements. In particular, the inaccessibility of certain spatial detail to real measurements is readily seen. A WMA fitting scheme for refining the SLD deduced from phase-inversion measurements in a manner consistent with the data-determined spatial resolution is demonstrated.