Anodic oxide films have been formed galvanostatically on Al-In alloys (containing up to 0.074% In) in a borate buffer solution (pH 7.8) at different current densities (20-100 muA cm(-2)). The mechanism, kinetics of growth and properties of formed oxide films have been investigated. The study of charge curves suggests that the growth of oxide films on Al-In alloys occurs by an activation-controlled ionic conduction under the influence of the high electric field through the oxide film according to an exponential law, like on valve metals. The following parameters have been calculated: the constants of the exponential law, ionic conductivity through the film, the effective activation distance for ion movement and the corresponding field strength. The values for the field strength, of the order of magnitude of 10(6) V cm(-1), justify the application of the high field migration mechanism. Properties of anodic oxide films have been determined by means of electrochemical impedance spectroscopy; the resistance and thickness of the oxide film have been found to increase with the increase in the indium content in the alloy and with increased anodic current density. It has been established that the current efficiency in oxide films formation on Al-In alloys is lower than 100%: the increase of the indium content in the alloy, as well as the increase in anodic current density, increases the value of current efficiency. (C) 2003 Elsevier Ltd. All rights reserved.