화학공학소재연구정보센터
Journal of Chemical Physics, Vol.120, No.17, 7927-7932, 2004
Electronic properties of CrF and CrCl in the X (6)Sigma(+) state: Observation of the halogen hyperfine structure by Fourier transform microwave spectroscopy
The rotational spectra of the CrF and CrCl radicals in the X(6)Sigma(+) state were observed by employing a Fourier transform microwave spectrometer. The CrF and CrCl radicals were generated by the reaction of laser-ablated Cr with F-2 and Cl-2, respectively, diluted in Ar. A chromium rod made of chromium powder pasted with epoxy resin was ablated by a Nd:YAG laser. Rotational transitions were measured in the region between 8 and 26 GHz. Several hyperfine constants due to the halogen nuclei were determined by a least-squares analysis. The electronic properties of CrF and CrCl were derived from their hyperfine constants and were compared with those of other 3d transition metal monohalides: TiF, MnF, FeF, CoF, NiF, and FeCl. (C) 2004 American Institute of Physics.