Predictions of electrostatic double-layer interaction forces between two similarly charged spherical colloidal particles inside an infinitely long "rough" capillary are presented. A simple model of a rough cylindrical surface is proposed, which assumes the capillary wall to be a periodic function of axial position. The periodic roughness of the wall is characterized by the wavelength and amplitude of the undulations. The electrostatic double-layer interaction force between two spherical particles located axially inside this rough capillary is determined by solving the nonlinear Poisson-Boltzmann equation employing finite element analysis. The effect of surface roughness of the cylindrical enclosure on the interaction force between two particles is extensively studied on the basis of this model. The simulations are carried out for dimensionless amplitudes (amplitude/particle radii) ranging from 0.05 to 0.15 and scaled wavelengths (wavelength/particle radii) ranging from 0.4 to 4.0. The interaction force between the particles is significantly modified by the proximity of the rough capillary wall. Generally, the interaction force for rough capillaries oscillates around the corresponding interaction force in a smooth capillary depending on the magnitudes of the scaled amplitude and wavelength of the roughness. The influence of roughness on the electrostatic interactions becomes more pronounced when the surface potential of the cylinder wall is different from the sphere surface potentials. When the cylinder and the particle surfaces have large potential differences, the axial force experienced by a particle is dominated by the capillary roughness. There are dramatic oscillations of the force, which alternately becomes repulsive and attractive as the particle moves from the crest to the trough of the rough capillary wall. These results suggest that manipulation of colloidal particles in narrow microchannels may be subject to significant force variations owing to the roughness inherent in microfabricated channels etched on metal films. (C) 2003 Elsevier Inc. All rights reserved.