Previous Article Next Article Table of Contents Journal of Materials Science, Vol.39, No.5, 1853-1855, 2004 DOI10.1023/B:JMSC.0000016202.96505.51 Export Citation X-ray diffraction analysis of the defect structure in AlxGa1-xN films grown by metalorganic chemical vapor deposition Park YS, Kim KH, Lee JJ, Kim HS, Kang TW, Jiang HX, Lin JY Please enable JavaScript to view the comments powered by Disqus.
