Previous Article Next Article Table of Contents Chemical Engineering & Technology, Vol.22, No.1, 19-22, 1999 DOI10.1002/(SICI)1521-4125(199901)22:1<19::AID-CEAT19>3.0.CO;2-W Export Citation A new method for the classification of micron and submicron particles Altmann J, Ripperger S Please enable JavaScript to view the comments powered by Disqus.