화학공학소재연구정보센터
Journal of Vacuum Science & Technology B, Vol.22, No.6, 3485-3488, 2004
High resolution electron beam lithography using a chemically amplified calix[4]arene based resist
The calix[4]arene based resist tetrakis (oxiran-2-ylmethoxy)-tetra-tert-butylcalix[4]arene is presented. The well known chemical amplification techniques can be applied to the nonpolymeric class of calixarenes resulting in area doses below 100 muC/cm(2) at 30 keV beam energy. This is achieved by application of the concept of cationic polymerization to a calix[4]arene derivative bearing four epoxide residues together with a photoacid generating triarylsulfonium salt. The high resolution capabilities of this calixarene based resist remain mainly intact under optimized bake parameters. (C) 2004 American Vacuum Society.