화학공학소재연구정보센터
Journal of Materials Science, Vol.40, No.12, 3143-3148, 2005
Interfacial thermal conductivity: Insights from atomic level simulation
We analyze the results of molecular-dynamics simulations of the interfacial (Kapitza) resistance of representative grain boundaries in Si. Simulations of the interactions of phonon wave packets with the Si grain boundaries show that the scattering process depends strongly on both the branch and wavelength of the incident phonons. This approach has the potential for providing detailed spectral information to mesoscale simulations of thermal transport in interfacial systems. (c) 2005 Springer Science + Business Media, Inc.