Previous Article Next Article Table of Contents Journal of Materials Science, Vol.40, No.16, 4369-4371, 2005 DOI10.1007/s10853-005-0779-4 Export Citation Transmission electron microscopy studies of the bonded SiC-SiC interface Yushin GN, Kvit AV, Sitar Z Please enable JavaScript to view the comments powered by Disqus.
