The glass-transition temperature, T-g, ofisotactic PMMA thin films has been measured for four thicknesses by enhanced Raman spectroscopy and ellipsometry. This was made possible by inserting a silica spacer layer between the film and the substrate. The use of such a spacer drastically improves the sensitivity of Raman scattering measurements. The improvement in the sensitivity allows us to study phenomena involving changes in molecular dynamics, such as the phase transition, and to probe the existence in very thin films of several thickness-dependent transition temperatures, T-g(h). This in turn is interpreted as the occurrence in the film of a layered structure. The influence of the polymer concentration on the conformation of the surface adsorbed polymer layer and therefore on T-g(h) is discussed.