Previous Article Next Article Table of Contents Journal of Materials Science, Vol.40, No.18, 5033-5036, 2005 DOI10.1007/s10853-005-1077-x Export Citation Quantitative characterization of the growth and morphological evolution of bicrystalline aluminum thin films Alsem DH, Stach EA, De Hosson JTM Please enable JavaScript to view the comments powered by Disqus.
