Previous Article Next Article Table of Contents Journal of the American Chemical Society, Vol.127, No.40, 13772-13773, 2005 DOI10.1021/ja0541229 Export Citation Recent advances in characterization of CaCu3Ti4O12 thin films by spectroscopic ellipsometric metrology Lo Nigro R, Malandrino G, Toro RG, Losurdo M, Bruno G, Fragala IL Please enable JavaScript to view the comments powered by Disqus.
