화학공학소재연구정보센터
Journal of the Electrochemical Society, Vol.152, No.12, E390-E397, 2005
Investigations on the diffusion of oxygen in nickel at 1000 degrees C by SIMS analysis
High-purity polycrystalline nickel foils have been oxidized at 1000 degrees C in laboratory air before being analyzed in secondary ion mass spectrometry to locally measure the oxygen content in solid solution. The values obtained in metallic grains are surprisingly the same before and after the oxidation treatments (between 5 and 10 atom ppm) and they are much lower than the ones predicted from the literature solubility and diffusion coefficient data at 1000 degrees C. It is shown that this discrepancy could have its origins in the purity level of the samples but also in the exclusive oxygen diffusion in nickel grain boundaries. This last assumption is supported by the occurrence of nickel oxide particles on the walls of voids located in grain boundaries.