Simplified two-dimensional quantification of the grown-in microdefect distributions in Czochralski grown silicon crystals [J. Electrochem. Soc., 152, G781 (2005)]

Kulkarni MS; Voronkov VV

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Journal of the Electrochemical Society, Vol.152, No.12, L17-L17, 2005

Simplified two-dimensional quantification of the grown-in microdefect distributions in Czochralski grown silicon crystals [J. Electrochem. Soc., 152, G781 (2005)]

Kulkarni MS, Voronkov VV