Journal of Vacuum Science & Technology B, Vol.23, No.6, 2390-2393, 2005
Magnetoresistance of patterned NiFe thin films with structures modified by atomic force microscope nanolithography
Surfaces of patterned NiFe strip-shaped thin films of 15-30 nm thickness were modified by nanowires of NiFe oxide. The NiFe oxide was fabricated by the atomic force microscopy (AFM) nano-oxidation technique. The anisotropy magnetoresistance was measured in order to study the effect of the nanowires in the magnetization reversal process. The domain wall was pinned at the nanowires of the NiFe oxide. It was indicated that the propagation of domain wall could be controlled by the AFM nanolithography. (c) 2005 American Vacuum Society.