We report on the preparation and structural characterization of piezoelectric films of aluminium nitride onto diamond substrates. The samples were fabricated by sequential radio frequency reactive diode sputtering processes, carried out at various temperatures, in a head vacuum system starting from stechiometric targets. The structural characterization of the films was performed by energy dispersive X-ray diffraction analysis. The deposition temperature was found to play a relevant role to obtain highly textured films with the c-axis perpendicular to the substrate surface, as required by surface-acoustic-wave applications. In particular, a minimum substrate temperature of 300 degrees C was needed in order to obtain any internal order along the c-axis while, increasing the temperature, the AlN < 002 > orientation becomes preferential. The rocking curve analysis revealed a good crystalline quality of the AlN films whose degree of epitaxy can be well described by a linearly increasing function of the temperature at which the films are grown. (c) 2005 Elsevier B.V All rights reserved.