Clean Technology, Vol.11, No.2, 69-74, June, 2005
원자간인력현미경을 이용한 분자수준의 중금속 이온 검출
Molecular Level Detection of Heavy Metal Ions Using Atomic Force Microscope
E-mail:
초록
본 연구에서는 AFM 양극산화법을 이용하여 서브마이크로 수준의 패턴을 구성하였다. 자기조립법으로 제조한 MPTMS/Si(100) 기질 위에 AFM 양극산화법으로 패턴을 형성하였고, 비에칭법을 이용하여 아민그룹을 지닌 기능기를 고정시켰다. 금속전극으로는 Frens 방법으로 제조한 금나노입자를 이용하였다. 금속이온의 흡착에 따른 전도도는 근거리의 경우 coherent tunneling에 의존하지만, 원거리 전극에서는 incoherent tunneling에 의존한다. 전극의 간격이 가까울수록 저항이 감소하여 센서의 감도와 최소검출능을 개선할 수 있었다. 또한 다중기능성을 부여하여 센서의 선택도를 부여하였으며, 패턴의 크기에 따른 최소검출농도를 낮출 수 있음을 확인하였다.
A metal ion detector with a submicron size electrode was fabricated by field-induced AFM oxidation. The square frame of the mesa pattern was functionalized by APTES for the metal ion detection, and the remaining portion was used as an electrode by the self-assembly of MPTMS for Au metal deposition. The conductance changed with the quantity of adsorbed copper ions, due to electron tunneling between the mobile and surface electrodes. The smaller electrode has a lower limit of detection due to the enhancement in electron tunneling through metal ions that are adsorbed between the conductive-tip (mobile) and the surface (fixed) electrode. This two-electrode system immobilized with different functional groups was successfully used in the selective adsorption and detection of target materials.
- Lee B, Kim Y, Lee H, Yi J, Microporous Mesoporous Mater., 50(1), 77 (2001)
- Kang T, Park Y, Yi J, Ind. Eng. Chem. Res., 43(6), 14784 (2004)
- Kim Y, Kim C, Choi I, Rengaraj S, Yi J, Environ. Sci. Technol., 38(3), 924 (2004)
- Gwo S, J. Phys. Chem. Solids, 62, 1673 (2001)
- Bloeb H, Staikov G, Schultze JW, Electrochim. Acta, 47, 335 (2001)
- Kim Y, Kang SK, Choi I, Lee J, Yi JH, J. Am. Chem. Soc., 127(26), 9380 (2005)
- Choi I, Kim Y, Kim C, Kim J, Choi K, Yi J, Key Eng. Mater., 277, 9036 (2005)
- Choi I, Kim Y, Kang SK, Lee J, Yi J, Korean J. Chem. Eng., 22(4), 635 (2005)
- Kang SK, Kim Y, Choi I, Lee j, Yi J, Microelectron. Eng., 81, 389 (2005)
- Kim Y, Choi I, Kang SK, Choi K, Yi J, Microelectron. Eng., 81, 341 (2005)
- Rajagopalan V, Boussaadand S, Tao NJ, Nano Lett., 3, 851 (2003)
- Kim Y, Choi I, Kang SK, Lee J, Yi J, Appl. Phys. Lett., 86(7), 073113 (2005)
- Salomon A, Cahen D, Lindsay S, Tomfohr J, Engelkes VB, Frisbie CD, Adv. Mater., 15, 1881 (2003)
- Adams DM, J. Phys. Chem. B, 107, 6668 (2003)
- Kim y, Choi I, Kang SK, Yi J, Appl. Phys. Lett., submitted (2005)
- Kim y, Kang SK, Choi I, Yi J, Appl. Phys. Lett., submitted (2005)