A simple and efficient technique is described for measuring photoluminescence (PL) maps of carbon nanotubes (NTs) in the extended IR range (1-2.3 mu m). It consists of preparing an NT/ surfactant/ gelatin film and measuring PL spectra using a combination of a tunable Ti-sapphire laser excitation and FTIR detection. This procedure has been applied to a wide range of single-and double-wall NTs unveiling chirality and diameter distributions that have so far been very difficult to measure. The problems associated with deducing these distributions are discussed by comparing absorption and PL mapping data for NT samples prepared under different conditions.