화학공학소재연구정보센터
Langmuir, Vol.23, No.5, 2615-2622, 2007
Effect of chain length and substrate temperature on the growth and morphology of n-alkane thin films
Near-edge X-ray absorption fine structure (NEXAFS) spectroscopy and microscopy has been used to study the orientational morphology of thin films of the linear alkanes n-C36H74 and n-C60H122, prepared by vacuum deposition onto NaCl (001) surfaces at ambient and elevated substrate temperatures. The orientational morphology, specifically, the nature of domains with lateral and normal orientation, is explored as a function of the chain length and the substrate temperature. It is found that the longer n-C60H122 molecules are laterally oriented on the substrate surface within the investigated substrate temperatures but that the morphology of these thin films varies with substrate temperature. The shorter n-C36H74 molecules are partially laterally oriented at low substrate temperature and are completely normally oriented at high substrate temperature. The relative magnitude of "side-by-side" and "end-to-end" intermolecular interactions leads to the formation of highly ordered alkane structures with a high aspect ratio. The formation of complex, nanoscale orientational morphologies are rationalized by considering kinetic and thermodynamic effects, in particular, the relative enthalpic and entropic contributions to the free energy associated with the different molecular orientations.