화학공학소재연구정보센터
Chemical Physics Letters, Vol.317, No.6, 631-636, 2000
Ultraviolet cavity ring-down spectroscopy of free radicals in etching plasmas
Many reactive species of interest in technological plasmas absorb light in the UV spectral region (200-300 nm). Measurement of these weak absorbances (typically 10(-2)-10(-4) for a single pass) allows us to determine their absolute concentration. Low-resolution absorption spectra of these systems have previously been obtained by broad-band absorption spectroscopy. Here we present spectra obtained using laser cavity ring-down spectroscopy, which has much higher spectral resolution, and potentially higher sensitivity. Spectra were obtained for CF, CF2, AlF and SiF2 radicals in capacitively-coupled radio-frequency plasmas in fluorocarbon gases. This technique offers the possibility of real-time (1 s) absolute concentration measurements during wafer processing.