First observation of in-plane X-ray diffraction arising from a single layered inorganic compound film by a grazing incidence X-ray diffraction system with a conventional laboratory X-ray source

Takahashi S; Taniguchi M; Omote K; Wakabayashi N; Tanaka R; Yamagishi A

Chemical Physics Letters, Vol.352, No.3-4, 213-219, 2002

DOI10.1016/S0009-2614(01)01446-4 Export Citation

First observation of in-plane X-ray diffraction arising from a single layered inorganic compound film by a grazing incidence X-ray diffraction system with a conventional laboratory X-ray source

Takahashi S, Taniguchi M, Omote K, Wakabayashi N, Tanaka R, Yamagishi A

Grazing incidence angle in-plane X-ray diffraction (in-plane XRD) was applied to characterization of an organic-inorganic hybrid Langmuir-Blodgett (LB) film in a laboratory scale. The hybrid LB film consisted of octadecyl ammonium cation and sodium montmorillonite layers at Si(100) wafer. The in-plane XRD measurements of the hybrid LB film gave one diffraction peak at 20.0degrees (0.44 nm), which we assigned to the (110) and (020) reflections of montmorillonite. This was the first example of the in-plane diffraction from a single layered montmorillonite, presenting a clear evidence for the parallel orientation of the (001) plane with respect to a film surface. (C) 2002 Elsevier Science B.V. All rights reserved.