The electronic structure of thin films of the prototypical organic semiconductor copper phthalocyanine (CuPc) has been measured using resonant soft X-ray emission spectroscopy. We report the observation of two discrete states near E-F. This differs from published photoemission results, but is in excellent agreement with density functional calculations. The implications of this result for the use of resonant soft X-ray emission (SXE) in the study of organic semiconductors are discussed. We also compare our data to published X-ray emission results, and show that the latter display clear evidence of beam damage. (C) 2004 Elsevier B.V. All rights reserved.