Observation of energy-filtered image for X-ray photoemission electron microscopy (EXPEEM) using a retarding Wien-filter energy analyzer

Yasufuku H; Ohminami Y; Tsutsumi T; Asakura K; Kato M; Sakai Y; Kitajima Y; Iwasawa Y

Chemistry Letters, Vol.31, No.8, 842-843, 2002

Yasufuku H, Ohminami Y, Tsutsumi T, Asakura K, Kato M, Sakai Y, Kitajima Y, Iwasawa Y

We observed surface images of the Au islands periodically deposited on a Ta sheet by means of an energy-filtered XPEEM using a retarding Wien-filter energy analyzer and a high energy X-ray. By changing the passing photoelectron kinetic energy (E-kin), we had a brighter Au island image at the E-kin = 0 eV and 60 eV while we had a brighter Ta substrate image at E-kin = 102 eV, corresponding to a Ta 3p(3/2) photoelectron peak.