The topology of crack tips in soda-lime-silicate glass was investigated using atomic force microscopy (AFM). Studies were conducted on cracks that were first propagated in water and then subjected to stress intensity factors either at or below the crack growth threshold. Exposure to loads at the crack growth threshold resulted in long delays to restart crack growth after increasing the stress intensity factor to higher values. After breaking the fracture specimen in two, the "upper" and "lower" fracture surfaces were mapped and compared using AFM. Fracture surfaces matched to an accuracy of better than 0.5 nm normal to the fracture plane and 5 nm within the fracture plane. Displacements between the upper and lower fracture surfaces that developed after a critical holding time were independent of distance from the crack tip, and increased with holding time. Despite the surface displacement, crack tips appeared to be sharp. Results are discussed in terms of a hydronium ion-alkali ion exchange along the crack surfaces and corrosion of the glass surface near the crack tip by hydroxyl ions.