Due to its peculiar laminated structure, dendritic web silicon presents one of the most interesting configurations of dislocations in Si crystals. On the way to growing dislocation-free Si webs, X-ray diffraction topography techniques were used to visualize the dislocations in the material. The results and the analysis of dislocation reactions reported here provide information on the mechanisms involved in the formation of dislocation networks in the material. Also, the applicability of synchrotron radiation white-beam topography for a rapid characterization of dislocations is investigated and discussed.