Copper bicrystals with twist character were grown using the vertical Bridgman technique. Cu bicrystals were grown such that the grain boundary in each sample had a nominal twist misorientation consisting of either a low angle (10 degrees), a special angle (Sigma5 = 36.87 degrees), or a high angle (45 degrees). The grain boundary plane in all cases was (1 0 0). The grain boundaries were grown using single-crystal seeds that were oriented to within +/-0.5 using the Laue buck-reflection X-ray diffraction method. The misorientation of each twist boundary was characterized using electron backscattering diffraction patterns in a scanning electron microscope. All grain boundary misorientations were determined to be within the limits defined by the Brandon criterion.