Journal of Crystal Growth, Vol.230, No.3-4, 448-453, 2001
Indium content determination related with structural and optical properties of InGaN layers
We studied the structural and optical properties of a set of nominally undoped epitaxial single layers of InxGa1-xN (0
Keywords:Rutherford backscattering;solid solutions;X-ray diffraction;gallium compounds;semiconducting III-V materials